The Pittcon Registration Committee is pleased to announce that conferee registration is now open for Pittcon 2012, which will be held March 11-15, 2012, at the Orange County Convention Center (OCCC), Orlando, Florida. Conferees registering before February 13, 2012, will save 50% on the registration fee.

Griefensee, Zurich - The 2011 AIChE Annual Meeting Separations Division (02) sessions will focus on how to better control crystallization conditions, improve cycle times and optimize product quality. One session co-chaired by METTLER TOLEDO’s Terry Redman, “PAT for Crystallization Development and Manufacturing,” is currently accepting papers on Process Analytical Technologies (PAT) for crystallization process development. Abstracts must be submitted by May 2, 2011.

Schwerzenbach, Switzerland - METTLER TOLEDO has scheduled the 18th Annual International Process Development Conference (IPDC) for September 25-29, 2011 at the Park Hotel in picturesque Weggis, Switzerland.

Quantachrome Instruments to Participate in COPS IX as Main Sponsor and Exhibitor, and with Contributions
from Chief Scientist.

We spent Tuesday March 2nd combing the floor of the exhibit hall taking photos and capturing videos at Pittcon 2010 in Orlando, FL. I personally wasn't able to attend but provided morale support to one of our media specialist Eric. Before I get into the content from the show I wanted to share a bit of our surprise at the reception we received when offering to promote companies products.

CEM Corporation, a leading global provider of microwave laboratory instrumentation, will sponsor Hats for Haiti, a fundraiser at Pittcon 2010 benefiting the Haitian earthquake relief effort. The Company will be offering its trademark Crazy Dave Beanies, which have become a tradition at the exhibition, for a $1 contribution.

ALMSCO International will showcase its new state-of-the-art BenchTOF-dx™ mass spectrometer for the first time at PITTCON 2010. Unlike conventional technology, the new compact reflectron time-of-flight (TOF) instrument is specifically designed to generate truly classical electron impact ionization (EI) spectra for gas chromatography (GC) and comprehensive GCxGC applications.

This free event takes place on Thursday, 18 February 2010 at 5pm Eastern Time - USA

Sponsored by Leica Microsystems, in association with PITTCON 2010

Speakers: Dr Christian Conrad, Screening Microscopy, AMLF, EMBL
Frank Sieckmann, senior project manager Leica Microsystems

Outline:

CHI's Fourth Annual Enabling Point-of-Care Diagnostics will be taking place August 24-25, 2010 at the Ritz-Carlton Hotel in Washington, D.C. Speaking proposals are currently being accepted until February 12, 2010. This event is part of CHI's Second Annual Next Generation Dx Summit (August 24-26, 2010). For more information, visit http://www.nextgenerationdx.com/poc.

Create online presence and support for technical products using video for web as a primary vehicle. This webinar will present ideas for creating, promoting and optimizing online videos for training, sales, and technical support of products.